Books by author Patrick Echlin

Showing 1 – 8 out of 8 results

1. 

   Scanning Electron Microscopy and X-Ray Microanalysis

   Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy | Springer-Verlag New York Inc., 2013

   
   

   Low in stock at our supplier - Shipping in 12 - 17 days

   Language: English

   Binding: Paperback

   139.52 €

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2. 

   Advanced Scanning Electron Microscopy and X-Ray Microanalysis

   Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy | Springer-Verlag New York Inc., 2013

   
   

   Low in stock at our supplier - Shipping in 10 - 15 days

   Language: English

   Binding: Paperback

   139.52 €

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3. 

   Low-Temperature Microscopy and Analysis

   Patrick Echlin | Springer-Verlag New York Inc., 2013

   
   

   Low in stock at our supplier - Shipping in 10 - 15 days

   Language: English

   Binding: Paperback

   277.10 €

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4. 

   Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

   Patrick Echlin | Springer-Verlag New York Inc., 2009

   
   

   Low in stock at our supplier - Shipping in 10 - 15 days

   Language: English

   Binding: Hardback

   202.06 €

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5. 

   Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

   Patrick Echlin | Springer-Verlag New York Inc., 2010

   
   

   In stock at our supplier - Shipping in 8 - 10 days

   Language: English

   Binding: Paperback

   169.92 €

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6. 

   Scanning Electron Microscopy and X-Ray Microanalysis

   Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy | Springer, Berlin, 2011

   
   

   Low in stock at our supplier - Shipping in 10 - 15 days

   Language: English

   Binding: Paperback

   139.52 €

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7. 

   Low-Temperature Microscopy and Analysis

   Patrick Echlin | Springer Science+Business Media, 1992

   
   

   Low in stock at our supplier - Shipping in 10 - 15 days

   Language: English

   Binding: Hardback

   277.10 €

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8. 

   Advanced Scanning Electron Microscopy and X-Ray Microanalysis

   Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy | Springer Science+Business Media

   
   

   50/50 - We search the world

   Language: English

   Binding: Hardback

   192.75 €

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